Teodor P. Gotszalk

Associate Professor
Wrocław University of Technology

Teodor P. Gotszalk received the M.Sc., Ph.D., and D.Sc. degrees in 1989, 1996, and 2005, respectively. His Ph.D. Thesis was awarded with the Siemens research prize in 2000. From 1993 to 1995 he was a Deutscher Akademischer Austauschdienst fellow at the University of Kassel, Germany where he worked on the application of piezoresistive cantilevers in scanning probe microscopy. He was also a fellow of the Polish Science Foundation in 1997. In the period of 1996–2010 he spent about three years working at the University of Kassel, at the Siemens A.G. Corporate Technology Microsystem Technology Centre 2 in Germany, and as a Fulbright Commission Fellow at the State University of New York in Albany at the College of Nanoscience and Engineering. 
At present T.P. Gotszalk is the Associate Professor at the Wroclaw University of Technology in Poland. He is a leader of the Nanometrology group at the Faculty of Microsystem Electronics and Photonics of this university. His scientific interests concentrate on application of modular scanning probe microscopy in diagnostics of micro− and nanoelectronic materials and devices, measurements of low forces and nanodisplacements with MEMS sensors and actuators, application of optical fibre techniques and optoelectronics in nanometrology. During last 10 years he published more than 120 papers.